REU Student: Linton Wells, Mentor: Dennis Manos

This paper reviews the uses of X-ray Photoelectron Spectroscopy(XPS), Auger Electron Spectroscopy, and Secondary Electron Microscopy(SEM) in providing data about the effects of surface modification and processing on various materials. Specifically, the surface processing technique of most interes is Plasma Source Ion Implantation(PSII). A description of PSII and of William and Mary's PSII system is provided as well.